View Original Image at Full SizeTi thin film on Si wafer measured by AES. Data from Montana State University, Imaging and Chemical Analysis Laboratory.
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Apr10 24
Last Modified: 2024-04-15 16:07:46
Permanent URL: https://serc.carleton.edu/download/images/341747/tisi_auger_depth_profile.webp
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Provenance
Dave Mogk, Montana State University-Bozeman
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